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XRD / WD-XRF

Crystallographic and compound analysis by XRD:


  • General composition (qualitative and quantitative phase identification)
  • Corrosion analysis and identification
  • Geological / Mineralogical analysis
  • Coatings
  • Thin-film Analysis
  • % Crystallinity
  • Crystallite size/strain
  • Industrial hygiene (e.g., respirable silica)

 

Elemental analysis by Wavelength Dispersion (WD) XRF:

 

  •        General composition – from B to U in low ppm to 100% concentrations

  •        Contamination

  •        Quality control – the use of calibrated as well as standardless methods

     

 
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